Title:
FLUORESCENT X-RAYS ANALYSIS DEVICE
Document Type and Number:
Japanese Patent JP3146574
Kind Code:
B2
Abstract:
PURPOSE: To obtain an accurately and stable analysis result by providing a means for increasing a temperature of a sample as compared with an atmosphere temperature within a vacuum chamber to be housed and then preventing adsorption of hydrocarbon to a sample surface.
CONSTITUTION: A sample holder 22 charged with a sample S is inserted through a sample insertion port 16 of a lower vacuum part 4b, a lid body 18 is adhered and engaged and inside of a lower vacuum part 4b is subjected to vacuum exhaust by a preliminary exhaust pipe 20, and then a shutter 14 is opened when a degree of vacuum is reduced to a level which is equivalent to that of an upper vacuum part 4a. At this time, a temperature of the sample S is close to an external air, is lower than an atmospheric temperature within the vacuum chamber 4, and hence adsorption of hydrocarbon which exists within the chamber 4 occurs on a surface of the sample S. Then, an infrared rays lamp 6 is lit for heating until a temperature of a surface of the sample S becomes slightly higher than the atmospheric temperature within the chamber 4 and contacting parts 22C and 23 with the sample holder 22 are heat- insulated by a heat-insulating material. When primary X rays are shed from an X-rays tube 2 to the sample S in this state, an accurate and stable analysis result can be obtained.
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Inventors:
Hideo Okashita
Takehiko Nakatani
Takehiko Nakatani
Application Number:
JP32035691A
Publication Date:
March 19, 2001
Filing Date:
December 04, 1991
Export Citation:
Assignee:
SHIMADZU CORPORATION
International Classes:
G01N23/223; (IPC1-7): G01N23/223
Domestic Patent References:
| JP2150555U |
Attorney, Agent or Firm:
Kazuhide Okada