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Title:
CAVITY EXAMINATION DEVICE
Document Type and Number:
Japanese Patent JP2016070934
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a cavity examination device 2 for examining an inner surface 4 of a cavity 6 in a workpiece 8, the examination device comprising a measuring head 10 that defines an axial direction 12 and has an optical element 14 arranged thereon with a field of view of 360 degrees, the optical element 14 connected with a digital image sensor 16 and a downstream arranged digital evaluation device so as to transfer images.SOLUTION: An embodiment is provided with means for acquiring surface depth profile information from output signals of the digital image sensor.SELECTED DRAWING: Figure 1

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Inventors:
MICHAEL RUDOLPH
Application Number:
JP2015188155A
Publication Date:
May 09, 2016
Filing Date:
September 25, 2015
Export Citation:
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Assignee:
JENOPTIK IND METROLOGY GERMANY GMBH
International Classes:
G01B11/24; G01B11/30; G01N21/954
Domestic Patent References:
JP2006513439A2006-04-20
JP2010261950A2010-11-18
JP2007531887A2007-11-08
JP2013096996A2013-05-20
JP2011017615A2011-01-27
Foreign References:
US20110001984A12011-01-06
Attorney, Agent or Firm:
Mitsufumi Esaki
Blacksmith
Atsushi Shinohara
Shinsuke Nakamura
Kiyota Eisho



 
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