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Title:
CHARGED PARTICLE DETECTING DEVICE
Document Type and Number:
Japanese Patent JP2002071821
Kind Code:
A
Abstract:

To provide a charged particle detecting device with high radiation resistance, fast time responsiveness, and particularly suitable for use as a heavy ion beam detector.

This device is provided with current sources 45 and 46 for feeding current to a superconducting tunnel junction element 41 composed by sandwiching a tunnel barrier by two superconductive metallic thin films, and a voltage detector 43 detecting voltage pulses occurring in the superconducting tunnel junction element. In a particle waiting state, the current source feeds a bias current to the superconducting tunnel junction element smaller than a critical current of the element and larger than a critical current which decreases when a charged particle is made incident on the element, and when a charged particle is made incident on the element, the current source resets the bias current to an initial bias current via a zero current using an output of the voltage detector 43 as a trigger.


Inventors:
SATO HIROMI
SHIMIZU HIROHIKO
IKEDA TOKIHIRO
OKU TAKAYUKI
TAKIZAWA YOSHIYUKI
WATANABE HIROSHI
KAWAI KAZUHIKO
OTANI TOMOYUKI
MIYASAKA HIROMASA
Application Number:
JP2000256149A
Publication Date:
March 12, 2002
Filing Date:
August 25, 2000
Export Citation:
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Assignee:
RIKAGAKU KENKYUSHO
International Classes:
G01T1/24; G01T1/29; G01T1/36; H01J49/06; H01L39/02; H01L39/04; H01L39/22; (IPC1-7): G01T1/24; G01T1/29; G01T1/36; H01J49/06; H01L39/02; H01L39/04; H01L39/22
Attorney, Agent or Firm:
Yusuke Hiraki (1 person outside)