Title:
CHEMICALLY-AMPLIFIED POSITIVE RESIST COMPOSITION AND RESIST PATTERNING METHOD
Document Type and Number:
Japanese Patent JP2015169790
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a chemically-amplified positive resist composition capable of providing a pattern having an extremely high resolution with low line edge roughness.SOLUTION: A chemically-amplified positive resist composition includes: (A) a salt represented by the formula (1); and (B) a resin containing a repeating unit represented by the following formula (U-1).
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Inventors:
DOMON DAISUKE
MASUNAGA KEIICHI
WATANABE SATOSHI
OHASHI MASAKI
FUKUSHIMA MASAHIRO
MASUNAGA KEIICHI
WATANABE SATOSHI
OHASHI MASAKI
FUKUSHIMA MASAHIRO
Application Number:
JP2014044510A
Publication Date:
September 28, 2015
Filing Date:
March 07, 2014
Export Citation:
Assignee:
SHINETSU CHEMICAL CO
International Classes:
G03F7/004; C07D327/08; C07D333/76; C08F12/24; C08F20/30; C09K3/00; G03F7/039
Domestic Patent References:
JP2011197464A | 2011-10-06 | |||
JP2009244805A | 2009-10-22 | |||
JP2011173855A | 2011-09-08 | |||
JP2013125146A | 2013-06-24 | |||
JP2013020226A | 2013-01-31 | |||
JPH09127700A | 1997-05-16 | |||
JP2015054833A | 2015-03-23 | |||
JP2002131898A | 2002-05-09 |
Foreign References:
WO2012173282A1 | 2012-12-20 |
Attorney, Agent or Firm:
Mikio Yoshimiya