Title:
チップキャパシタ検査選別装置
Document Type and Number:
Japanese Patent JP6312200
Kind Code:
B2
Abstract:
The invention relates to a chip-type electronic component checking and classifying apparatus. With the chip-type electronic component checking ans sorting apparatus provided herein, the efficiency of the chip-type electronic component checking sorting apparatus of checking and classifying a tiny chip-type electronic component with high speed is improved and the decrease in the checking accuracy is inhibited to occur. The chip-type electronic component checking and classifying apparatus comprises a chip-type electronic component delivering round disc supported by a base station shaft in a rotary way, a component supply storage part that is sequentially set along the rotating path of the delivery round disc and that enables the chip-type electronic component to be supplied and stored in a through hole of the delivering round disc, a checking part of electric property of the chip-type electronic component, and a classifying part of checked chip-type electric component; the apparatus provided herein is characterized in that a chip-type electronic component removal unit is set between the rear end position of the chip-type electronic component supply storage part and the front end position of the checking part along the position of the rotating path of the delivering round disc so as to enable the chip-type electronic component with abnormal storage state in the through hole to be separate from the through hole.
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Inventors:
Nobuo Sawa
Application Number:
JP2014022509A
Publication Date:
April 18, 2018
Filing Date:
February 07, 2014
Export Citation:
Assignee:
Human Laboratory Co., Ltd.
International Classes:
B07C5/36; B65G47/14; B65G47/80
Domestic Patent References:
| JP2001026318A | ||||
| JP2007161355A | ||||
| JP2006225110A | ||||
| JP9002644A |
Foreign References:
| US20050010328 |
Attorney, Agent or Firm:
Yanagawa Yasuo