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Title:
CLEANING METHOD AND CLEANING FLUID SUPPLYING APPARATUS
Document Type and Number:
Japanese Patent JP2013145386
Kind Code:
A
Abstract:

To provide a cleaning method with which generation of foreign matter can be extremely reduced when a substrate to be cleaned such as a transparent substrate for a photomask, a photomask blank, a photomask production intermediate, and a photomask, is cleaned, and provide a cleaning fluid supplying apparatus that supplies cleaning fluid to a cleaning apparatus.

In a cleaning method for cleaning a substrate to be cleaned by supplying cleaning fluid to a cleaning apparatus, when the cleaning fluid is filtered by a filtration filter for removing foreign matter and the filtered cleaning fluid is supplied to the cleaning apparatus through a supply pipe to clean the substrate to be cleaned, at least prior to supply of the filtered cleaning fluid to the cleaning apparatus, the filtered cleaning fluid is discharged to the outside of a system through a discharge pipe and then the filtered cleaning fluid is supplied to the cleaning apparatus through the supply pipe.


Inventors:
NUMANAMI TSUNEO
Application Number:
JP2013034560A
Publication Date:
July 25, 2013
Filing Date:
February 25, 2013
Export Citation:
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Assignee:
SHINETSU CHEMICAL CO
International Classes:
G03F1/82; B08B3/08; H01L21/304
Domestic Patent References:
JP2002035704A2002-02-05
JPH10305248A1998-11-17
JP2007258367A2007-10-04
JP2007152207A2007-06-21
JP2005202135A2005-07-28
JP2002043210A2002-02-08
JPH0691277A1994-04-05
JP2001077015A2001-03-23
JPH07283184A1995-10-27
Attorney, Agent or Firm:
Mikio Yoshimiya