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Title:
CLINICAL EXAMINATION SYSTEM
Document Type and Number:
Japanese Patent JP2008096218
Kind Code:
A
Abstract:

To provide a clinical examination system that takes into consideration the "uncertainty", and the like, of examination data, in normal daily examinations.

The clinical examination system that includes an in vitro diagnostic examination apparatus is equipped with an examination device for outputting measured data and a comparison system for comparing the measuring data, outputted from the examination device, with various determination levels. When the values of the measured data due to the comparison system are compared with the determination levels, the measured data is automatically discriminated as data having width, that takes into consideration measurement errors or the uncertainty in the examination data.


Inventors:
MABE SUGIO
Application Number:
JP2006276875A
Publication Date:
April 24, 2008
Filing Date:
October 10, 2006
Export Citation:
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Assignee:
OLYMPUS CORP
International Classes:
G01N35/00
Domestic Patent References:
JPH03125576U1991-12-18
JPH07103972A1995-04-21
JP2000099598A2000-04-07
JPH102902A1998-01-06
JPH02126399A1990-05-15