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Title:
PLANT MONITORING AND DIAGNOSING SYSTEM AND NON-DESTRUCTIVE INSPECTING AND DIAGNOSING SYSTEM
Document Type and Number:
Japanese Patent JP3169036
Kind Code:
B2
Abstract:

PURPOSE: To provide a non-destructive inspecting and diagnosing system which can exactly monitor and diagnose a plant and easily recognize an occurred defect.
CONSTITUTION: Reference characters 1a-1c show sensors, and 2a-2c show signal processors. A state quantity calculator 3 calculates a quantity of state for representing an environment of a plant based on monitor information to be input from the processors 2a-2c. A state predicting unit 4 calculates to predict the quantity of the state after a predetermined time based on the quantity of the state, monitor information to be input from the calculator 3 and timing change of the quantity of the state. A future event predicting unit 5 predicts a future event based on the predicting information of the quantity of the state to be input from the unit 4. An image information processor 6a converts the quantity of the state to be input from the calculator 3 into image information, and displays it on a display unit 7a. An image information processor 6b converts the predicted quantity of the state after the predetermined time to be input from the unit 4 into image information, and displays it on a display unit 7b. An image information processor 6c converts the future event predicted by the unit 5 into image information, and displays it on a display unit 7c.


Inventors:
Fuminobu Takahashi
Masahiro Koike
Shunsuke Uchida
Haruo Fujimori
Izumi Yamada
Koji Fukusaki
Makoto Nagase
Application Number:
JP13457293A
Publication Date:
May 21, 2001
Filing Date:
June 04, 1993
Export Citation:
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Assignee:
株式会社日立製作所
International Classes:
G01M99/00; G05B23/02; G21C17/00; (IPC1-7): G01M19/00
Domestic Patent References:
JP526702A
JP3134594A
JP1182797A
JP371340A
JP4195300A
JP5181787A
Attorney, Agent or Firm:
Yukihiko Takada



 
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