To provide a combination test data generation device for efficiently improving the quality of a computer system.
The combination test data generation device includes: a variation data acquisition part 102 for acquiring variation data; a variation data storage part 103; a combination test data generation part 104 for generating combination test data; a combination test data storage part 105; an exclusion data acquisition part 106 for acquiring exclusion data; an exclusion data storage part 107; a combination test data exclusion processing part 108 for excluding the combination test data corresponding to the exclusion data; a correction value information acquisition part 109 for acquiring correction value information; a correction value information storage part 110; a combination test priority correction part 111 for correcting combination test priority in the combination test data based on the correction value information; a sort processing part 112 for sorting the combination test data; a display control part 113 for controlling the display of the combination test data; and a display device 114.
SASAKI JUNKO
Rie Kudo
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