Title:
CONTACT PROBE FOR HIGH FREQUENCY
Document Type and Number:
Japanese Patent JP2009175003
Kind Code:
A
Abstract:
To make constitution simple and operation easy and handling, and attain measurements of high quality.
A center conductor pin 15 is disposed, protruding from a probe body 10 and twelve ground pins 17 are concentrically disposed, to surround the center conductor pin 15, in which the twelve ground pins 17 are provided at an outer conductor 12 via spring members 18, independently and freely movably in the axial direction.
Inventors:
SUZUKI RYOTA
YAMASHITA YUSUKE
YAMASHITA YUSUKE
Application Number:
JP2008013913A
Publication Date:
August 06, 2009
Filing Date:
January 24, 2008
Export Citation:
Assignee:
TOSHIBA CORP
International Classes:
G01R1/067
Domestic Patent References:
| JPH063371A | 1994-01-11 | |||
| JPH095357A | 1997-01-10 | |||
| JPS6327878U | 1988-02-24 |
Attorney, Agent or Firm:
Takehiko Suzue
Kurata Masatoshi
Satoshi Kono
Makoto Nakamura
Yoshihiro Fukuhara
Takashi Mine
Toshio Shirane
Sadao Muramatsu
Nobuhisa Nogawa
Kocho Chojiro
Naoki Kono
Katsu Sunagawa
Katsumura Hiro
Ryo Hashimoto
Tetsuya Kazama
Shoji Kawai
Tatsushi Sato
Takashi Okada
Mihoko Horiuchi
Takenori Masanori
Takuzo Ichihara
Yamashita Gen
Kurata Masatoshi
Satoshi Kono
Makoto Nakamura
Yoshihiro Fukuhara
Takashi Mine
Toshio Shirane
Sadao Muramatsu
Nobuhisa Nogawa
Kocho Chojiro
Naoki Kono
Katsu Sunagawa
Katsumura Hiro
Ryo Hashimoto
Tetsuya Kazama
Shoji Kawai
Tatsushi Sato
Takashi Okada
Mihoko Horiuchi
Takenori Masanori
Takuzo Ichihara
Yamashita Gen
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