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Title:
CRACK DEPTH MEASUREMENT METHOD
Document Type and Number:
Japanese Patent JP2011027586
Kind Code:
A
Abstract:

To provide a crack depth measurement method for correctly measuring a crack depth formed from a surface of a hardened cement object to the inside.

In the crack depth measurement method, the crack depth is calculated by the first formula: d=-α×λ×InF. In the first formula, the d is the crack depth (mm), and the λ is a primary wavelength (mm). The F is an amplitude ratio obtained by dividing the second minimum negative amplitude fluctuated toward the negative side right after a surface wave is initiated among the second surface waves propagated on a surface of the hardened cement object and detected in a second sensor 13 by the first minimum negative amplitude fluctuated toward the negative side right after the surface wave is initiated among the first surface waves propagated on the surface of the hardened cement object and detected in a first sensor 12, and the α is a constant (0.381) calculated from an approximate expression: y=αebx derived from a correlation diagram for indicating the (F) along a vertical axis, and a ratio of the crack depth (d)/the primary wavelength (λ) along a horizontal axis.


Inventors:
CHAI HWA KIAN
MOMOKI SHOHEI
Application Number:
JP2009174371A
Publication Date:
February 10, 2011
Filing Date:
July 27, 2009
Export Citation:
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Assignee:
TOBISHIMA CONSTRUCT CO LTD
International Classes:
G01N29/12; G01B17/00; G01N29/44
Domestic Patent References:
JP2001012933A2001-01-19
JP2007017298A2007-01-25
JPH11271286A1999-10-05
JPS6093955A1985-05-25
JP2008157775A2008-07-10
JP2006349628A2006-12-28
JP2007017300A2007-01-25
Attorney, Agent or Firm:
Yoshitaka Kobayashi



 
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