CREDIT EXAMINATION METHOD AND CREDIT EXAMINATION SYSTEM

Title:

CREDIT EXAMINATION METHOD AND CREDIT EXAMINATION SYSTEM

Document Type and Number:

Japanese Patent JP2004046525

Kind Code:

A

Abstract:

To provide a credit examination method capable of performing the loan acceptance to more customers by dispersing the credit risk of a customer as much as possible in the credit determination for a loan.

The data related to the customer are inputted (401), the credit examination for the customer is performed by use of the data (402), and the data related to the customer who is determined as "no execution of loan" in the credit examination are accumulated as refused customer information (405). A combination of one or more customer data of the refused customer information including the customer data determined as "no execution of loan" and accumulated before then is formed (407), the combination result is displayed (408), and the credit examination for a plurality of customers constituting the combination is performed (409) in reference to the display of the combination result.

Inventors:

NOZAKI MASARU
SAKASHITA MASAHIRO
IDE YUJI
YOKOTA TAKESHI
SATO RYOJI
NISHIDA MASAO

Application Number:

JP2002202866A

Publication Date:

February 12, 2004

Filing Date:

July 11, 2002

Export Citation:

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Assignee:

HITACHI LTD
HITACHI CAPITAL CORP

International Classes:

G06Q40/06; G06Q40/00; G06Q40/02; G06Q40/04; (IPC1-7): G06F17/60

Attorney, Agent or Firm:

Kenjiro Take

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