To provide a support device and a support method for inspecting crystalline structure of a metal material or the like capable of processing an image precisely, by correction-processing a noise component and an interrupted portion included inevitably in an original image of a photographed crystal grain, using an algorithm utilizing electric circuit simulation skillfully, and by making the best sufficient use of performance of a "watershed method" suitable for inherent edge image processing.
This support device includes a photographing means 1 capable of photographing the original image P of the crystalline structure comprising the crystal grain S of the metal material or the like, by a microscope 11, and a computer 2 capable of receiving a data of the original image P from the photographing means 1. Brightness of each picture element of the original image P received by the computer 2 is detected by a brightness detecting means 21, and a difference between the brightnesses in the adjacent fellow picture elements, or an edge of the each crystal grain S included in the original image P by inversion of black and white picture elements can be extracted by an edge extracting means 22. The computer 2 includes also an electric circuit simulator means 23.
COPYRIGHT: (C)2007,JPO&INPIT
Miaki Tomita
Kozo Kaneda
Mitani Corporation
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平野健嗣 他,電気回路シミュレーションに基づく画像エッジの補間・強調処理とその画像セグメンテーションへの応用,電子情報通信学会論文誌A,日本,2002年10月,Vol. J85-A, No. 10,pp. 1079 - 1090
吉田俊之 他,特殊なエッジ補間・強調手法を利用した顕微鏡画像の領域分割法,電子情報通信学会技術研究報告,日本,社団法人 電子情報通信学会,2004年12月 9日,Vol. 104, No. 511,p13 - p20