Title:
Data analysis method
Document Type and Number:
Japanese Patent JP6350626
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a microparticle measuring device capable of calibrating measurement errors by simple processing.SOLUTION: A microparticle measuring device includes: a detecting part for detecting light from microparticles with a plurality of photodetectors differing in a detectable wavelength region; and a processing part for calibrating intensity values of the light obtained by the detecting part with the detectable wavelength region widths of each photodetector to calculate first calibrated intensity values.SELECTED DRAWING: Figure 1
Inventors:
Nitta Takashi
Application Number:
JP2016191263A
Publication Date:
July 04, 2018
Filing Date:
September 29, 2016
Export Citation:
Assignee:
ソニー株式会社
International Classes:
G01N15/14
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Foreign References:
| US20080285036 |
Attorney, Agent or Firm:
Kaoru Watanabe