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Title:
X線検査におけるデータ処理装置及びデータ処理方法、並びに、その装置を搭載したX線検査装置
Document Type and Number:
Japanese Patent JP7161212
Kind Code:
B2
Abstract:
In presenting identified results of the type and/or property of substances of an object, interface functions for identification processes are enhanced without being independent of observation directions. In a data processing apparatus (12), image data are calculated based on photon counts of an X-ray beam transmitted through an object. Based on the image data, for example, every one of n-piece energy ranges (n is a positive integer of two or more) of the X-ray spectrum and every one detector pixel, attenuation information of the X-ray beam is calculated. The attenuation information includes i) inherent information inherently depending on a type or a property of the object, the inherent information being indicated by a quantity of a vector in an n-dimensional coordinate whose dimension is equal in number to the n-piece energy ranges; and ii) associated information being associated with the inherent information and depending on a length of a path along which the X-ray beam passes though the object. From the attenuation information, only the inherent information is produced which is independent of the associated information. Scattering points corresponding to the inherent information are calculated to be mapped in the n-dimensional coordinate or in a coordinate whose dimension is less than the n-dimensional coordinate.

Inventors:
Tsutomu Yamakawa
Shuichiro Yamamoto
Masahiro Okada
Application Number:
JP2019518825A
Publication Date:
October 26, 2022
Filing Date:
May 16, 2018
Export Citation:
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Assignee:
Job Co., Ltd.
International Classes:
G01N23/087; A61B6/00; G01N23/044; G01N23/18
Domestic Patent References:
JP2013119000A
Foreign References:
WO2016171186A1
WO2017069286A1
WO2014126189A1
US20130110438
Attorney, Agent or Firm:
Clear stream international patent attorney corporation
Daytime Takayoshi
Sakazawa Masao