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Title:
DC LOW NOISE MEASURING SYSTEM
Document Type and Number:
Japanese Patent JP2501011
Kind Code:
B2
Abstract:

PURPOSE: To create a calm environment for measuring a dc low noise in a metal connecting part and precisely measure the noise of a level close to Johnson Noise.
CONSTITUTION: The whole system 10 is sealed by a brass box 12 lined with a mu-metal, and placed on an active air table 14 to suppress external electric magnetic and mechanical obstructions. An upper shelf 16 holds two low noise preamplifiers and two low noise transformers, and a lower shelf 18 houses a sealed lead-acid battery in the rear part. A brass subject device 22 is arranged at the right under the front part of the lower shelf 18, and a brass sample oven 26 is placed on a Teflon square 28 within the device 22, and thermally insulated from the device 22. The oven 26 is enclosed by a mu-metal surrounding wall 30, and lined with an insulator 32 and a reflector 34. According to this structure, such a calm environment that no background noise can be measured can be created.


Inventors:
GUREN AREN BIARII
DANIERU MAAKU BOIN
KENISU PAAKAA ROTSUDOBERU
RICHAADO JOOJI SUMISU
MAIKERU HEMUZURII UTSUDO
Application Number:
JP27168893A
Publication Date:
May 29, 1996
Filing Date:
October 29, 1993
Export Citation:
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Assignee:
INTAANASHONARU BIJINESU MASHIINZU CORP
International Classes:
G01R29/26; H01L21/66; G01R31/26; (IPC1-7): G01R31/26; H01L21/66
Domestic Patent References:
JP5636061A
Attorney, Agent or Firm:
Koichi Tonmiya (4 outside)



 
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