Title:
DEFECT INSPECTING DEVICE FOR CYLINDRICAL INNER WALL SURFACE
Document Type and Number:
Japanese Patent JP3678850
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a defect inspecting device for cylindrical inner wall surface in which a defect i.nspection can be performed for the whole inner wall surface including the edge part on both opening ends of a cylinder.
SOLUTION: This inspecting device is formed of a defect inspection part for inspecting a defect on the inner wall surface of a cylinder having both end parts laid in open state, and an image processing part for processing the signal from the inspection part. In the detect inspection part, an area type sensor 1, a ring luminaire 2, a light diffusion plate 3, a holder of cylinder and a back light 5 are arranged along the central axis in order at prescribed intervals. The ring luminaire 2 is arranged concentrically with the central axis, and the light diffusion plate 3 has a circular through-hole formed in the center part, and it is arranged concentrically with the central axis. The area type sensor 1 for detecting the reflected light from the inner wall surface of the cylinder, and a plurality of pieces are arranged symmetrically to the center axis.
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| JPS60198437 | SURFACE INSPECTING DEVICE USING LASER LIGHT |
Inventors:
Toda Masatoshi
Masaki Fuse
Tokuyuki Ikeda
Junichi Harada
Masaki Fuse
Tokuyuki Ikeda
Junichi Harada
Application Number:
JP21762796A
Publication Date:
August 03, 2005
Filing Date:
August 19, 1996
Export Citation:
Assignee:
MEC Corporation
International Classes:
G01N21/88; G01N21/954; (IPC1-7): G01N21/954
Domestic Patent References:
| JP5045302A | ||||
| JP4340450A | ||||
| JP7190941A | ||||
| JP5784061A |
Attorney, Agent or Firm:
Masatake Shiga
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