DEFECT MEASURING DEVICE AND METHOD OF SPECIMEN

Title:

DEFECT MEASURING DEVICE AND METHOD OF SPECIMEN

Document Type and Number:

Japanese Patent JP2001235452

Kind Code:

A

Abstract:

To perform objective evaluation without damaging a specimen and detect the defect of the specimen regardless of the size and place of the defect of the specimen (cracks and inside cracks of a material board or the like).

The device is provided with an inspection jig 10 having a specimen attaching part 11 attaching the specimen 1, a vibrator 22 exciting the specimen 1, and a sound collecting device 20 for collecting vibration sound when the specimen 1 is excited by the vibrator 22; and a sound detection machine 30 frequency-analyzing the vibration sound collected by the sound collecting device 20. The defect of the specimen is judged by extracting and analyzing an exciting sound in time series when the specimen 1 is excited by the vibrator 22.

Inventors:

NISHIZONO SHIGEO

Application Number:

JP2000048664A

Publication Date:

August 31, 2001

Filing Date:

February 25, 2000

Export Citation:

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Assignee:

MITSUBISHI ELECTRIC CORP

International Classes:

G01H13/00; G01M7/02; G01N29/12; G01N29/22; (IPC1-7): G01N29/12; G01M7/02

Attorney, Agent or Firm:

Hiroshi Murakami (2 outside)

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