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Title:
DELAY PROFILE MEASUREMENT APPARATUS AND DELAY PROFILE MEASUREMENT METHOD
Document Type and Number:
Japanese Patent JP2004023405
Kind Code:
A
Abstract:

To improve temporal resolution in a delay profile measurement.

An N→E/N point number increase section 14 increases the number of discrete points of a Fourier-transformed received signal S(k) and an S0(k) E/N point IDFT section 16 applies inverse discrete Fourier transform to the result to acquire a complex progression s0(n). A maximum amplitude / delay time detection section 26 detects a maximum value (absolute value) Pi of the amplitude of a complex progression si(n) (n: discrete point, 0≤n≤E/N-1) and a discrete point ni at that time as to each correction step i (0≤i≤J-1). A subtraction section 20 acquires the complex progression si(n) by using a prescribed correction expression si+1(n)=si(n)-Pi×b(n-ni) including the result of detection and a correction function b(n) for each correction step i. The si+1(n) is used for a complex progression si+1(n) for a succeeding correction step i+1. The complex progression si(n) obtained by repeating the correction step i above for a prescribed number of times (once or over) is acquired as the delay profile.


Inventors:
SHIBATA TAKAKI
NAKAGAWA YUKIHIKO
Application Number:
JP2002174917A
Publication Date:
January 22, 2004
Filing Date:
June 14, 2002
Export Citation:
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Assignee:
JAPAN RADIO CO LTD
International Classes:
H04J11/00; (IPC1-7): H04J11/00
Attorney, Agent or Firm:
Kenji Yoshida
Jun Ishida