Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
DETECTING METHOD OF DEFECT
Document Type and Number:
Japanese Patent JPH04106460
Kind Code:
A
Abstract:

PURPOSE: To enable correct detection of each defect from an image wherein defects of different brightness exist mixedly, by removing overlapping by detecting the defects which are discriminated commonly by two kinds of parameters.

CONSTITUTION: An image is inputted from a camera and binary-coded with a threshold value of a level 1, noise is removed therefrom and labeling is made. Next, images 2 and 3 binary-coded with the threshold value of the level 1 are subjected to a discriminating processing and the results are stored in a buffer I. Subsequently, they are binary-coded with a threshold value of a level 2, noise is removed therefrom and labeling is made. The images binary-coded with the threshold value of the level 2 are subjected to the discriminating processing and the results are stored in a buffer II. Then, a common defect out of ones detected in the two processings is detected, so as to prevent a double count. By this method, each defect can be detected correctly from the image wherein the defects of different brightness exist mixedly.


Inventors:
HAYASHI TAKESHI
Application Number:
JP22435190A
Publication Date:
April 08, 1992
Filing Date:
August 28, 1990
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
TOSHIBA CORP
International Classes:
G01N21/88; G06T7/00; G06T7/60; H04N7/18; G01B11/30; (IPC1-7): G01B11/30; G01N21/88; G06F15/70; H04N7/18
Attorney, Agent or Firm:
Hideaki Togawa



 
Previous Patent: JPH04106459

Next Patent: INSPECTING APPARATUS OF SURFACE DEFECT