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Patent Searching and Data


Title:
DETECTION CIRCUIT FOR WIRING FAILURE
Document Type and Number:
Japanese Patent JPS6228676
Kind Code:
A
Abstract:

PURPOSE: To provide a wiring tester dealing with any kind of wiring, by connecting a diode to each of input terminals of exclusive OR circuits, and using the two terminals of each exclusive OR circuit as a test terminal and a reference terminal respectively.

CONSTITUTION: Diodes 2 are connected to input terminals of exclusive OR circuits 1, and the input terminals of the circuits 1 act as test terminals A1WA4, and reference terminals B1WB4. Also, cathodes of the diodes 2 act as pulse input terminals C1WC4, and failure detection signals are given at output terminals Y1WY4. Therefore, distinction between open H and signal level H, and distinction between a short circuit of input terminals A1-A2 for two circuits 1 in open H state and input terminals B1, B2 that exist independently are made possible. Thus, by connecting a wiring to be checked to the test terminals A1WA4, and a nonfailure wiring to reference terminals B1WB4, all of wiring faults, wiring errors, excessive wiring and short circuits can be detected.


Inventors:
MATSUMURA HIROSHI
Application Number:
JP16683185A
Publication Date:
February 06, 1987
Filing Date:
July 30, 1985
Export Citation:
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Assignee:
MATSUMURA HIROSHI
International Classes:
G01R31/02; (IPC1-7): G01R31/02