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Title:
積層セラミックコンデンサの良否判定方法
Document Type and Number:
Japanese Patent JP7127369
Kind Code:
B2
Abstract:
To determine a good item and a defective item of multilayer ceramic capacitor accurately, by measuring insulation resistance accurately.SOLUTION: A quality determination method of multilayer ceramic capacitor includes: a step (step S1) of preparing a multilayer ceramic capacitor having an element composed of dielectric ceramic, multiple internal electrodes embedded in the element in such a manner as being pulled out alternately to the first and second end faces of the element, and a pair of external electrodes provided on the first and second end faces of the element, and connected with the internal electrodes; a step (step S2) of applying a prescribed voltage to the pair of external electrodes, for a recharge time T determined based on a dielectric constant ε of the multilayer ceramic capacitor; a step (step S3) of measuring the insulation resistance after application of the prescribed voltage; and a step (step S4) of determining the quality of the multilayer ceramic capacitor, on the basis of the measured insulation resistance.SELECTED DRAWING: Figure 5

Inventors:
Katsuhiko Hara
Application Number:
JP2018109729A
Publication Date:
August 30, 2022
Filing Date:
June 07, 2018
Export Citation:
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Assignee:
MURATA MANUFACTURING CO.,LTD.
International Classes:
H01G13/00; G01R27/02
Domestic Patent References:
JP2000124088A
JP2002296313A
JP11083926A
JP2003217990A
JP2016062781A
JP2009295606A
JP2001284197A
Foreign References:
US20120153966
Attorney, Agent or Firm:
Nishizawa Hitoshi
Takahiro Nosue