Title:
DEVICE ABNORMALITY DIAGNOSTIC METHOD
Document Type and Number:
Japanese Patent JPH05233585
Kind Code:
A
Abstract:
PURPOSE: To provide a device abnormality diagnostic method using a neural network whose scale can be economically extended in a short time.
CONSTITUTION: Outputs from various sensors provided on a device are inputted to input layers X1 to Xn of a first neural network 1, and learning is so performed that outputs corresponding to these inputs are obtained from output layers Z1 to Zj, thereby determining a coupling coefficient. Thereafter, the outputs of output layers Z1 to Zj of the first neural network 1 and outputs from new sensors are inputted to secondary input layers Z1 to Zj and Xn+1 to Xm of a second neural network 2, and the coupling coefficient of the first neural network is effectively used to learn the second neural network.
Inventors:
TAKAHASHI ISAO
ENDO FUMIMASA
YAMAGIWA TOKIO
ENDO FUMIMASA
YAMAGIWA TOKIO
Application Number:
JP3651492A
Publication Date:
September 10, 1993
Filing Date:
February 24, 1992
Export Citation:
Assignee:
HITACHI LTD
International Classes:
G01D21/00; G01R31/00; G05B13/02; G05B23/02; G06F15/18; G06N3/04; G06N99/00; (IPC1-7): G06F15/18; G01D21/00; G01R31/00; G05B13/02
Domestic Patent References:
| JPH03219362A | 1991-09-26 | |||
| JPH02264354A | 1990-10-29 |
Attorney, Agent or Firm:
Kenjiro Take