Title:
DEVICE CHARACTERISTIC MEASURING CIRCUIT AND DEVICE CHARACTERISTIC MEASUREMENT METHOD
Document Type and Number:
Japanese Patent JP2019020189
Kind Code:
A
Abstract:
To provide a device characteristic measuring circuit with which it is possible to measure a gate input capacity immediately after the device is shorted.SOLUTION: A semiconductor device according to an embodiment of the present invention comprises: a first DC power supply electrically connected to the gate electrode of a device to be measured that has a first electrode, a second electrode and the gate electrode; an AC signal source electrically connected to the gate electrode; an inductor electrically connected at one end to the first DC power supply and electrically connected at other end to the gate electrode; at least one diode provided in parallel with the inductor, with the anode electrically connected to the gate electrode, the cathode electrically connected to the first DC power supply; a capacitor electrically connected at one end to the AC signal source and electrically connected at other end to the anode and the first other end of the inductor; a second DC power supply electrically connected at one end to the second electrode; and a switching element electrically connected at one end to the second electrode and electrically connected at other end to the second DC power supply.SELECTED DRAWING: Figure 1
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Inventors:
MIYAZAKI TAKASHI
IKEDA KENTARO
TAKAO KAZUTO
IKEDA KENTARO
TAKAO KAZUTO
Application Number:
JP2017136992A
Publication Date:
February 07, 2019
Filing Date:
July 13, 2017
Export Citation:
Assignee:
TOSHIBA CORP
International Classes:
G01R31/26
Attorney, Agent or Firm:
Tetsuma Ikegami
Akira Sudo
Mitsuyuki Matsuyama
Akira Sudo
Mitsuyuki Matsuyama