Title:
DEVICE FOR DETECTING AND RECORDING PARAMETER OF LONG ELONGATED TEST SAMPLE
Document Type and Number:
Japanese Patent JPH1123235
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide an inexpensive device for detecting and recording parameter of long elongated test sample which has a small space and can be manufactured easily. SOLUTION: A device for detecting and recording parameter of long elongated test sample is composed of a light source 2 for illuminating at least one area 21 of a test sample 1 and detects and records the parameter of the sample 1. In order to provide the above-mentioned type of device which does not require any large space at a low cost by manufacturing the device easily, it is preferable to design a radiator having a planar structure to emit diffused light instead of using the light source 2. The radiator is connected to an electrode 5 which is made of such a material that can transmit the beam emitted from the radiator, namely, a transparent material. In addition, it is preferable to apply the electrode 5 to the radiator in the form of a layer.
Inventors:
PIRANI PETER
Application Number:
JP17794198A
Publication Date:
January 29, 1999
Filing Date:
May 22, 1998
Export Citation:
Assignee:
LUWA AG ZELLWEGER
International Classes:
G01B11/10; D01G31/00; D01H13/14; D01H13/22; G01B11/28; G01B11/30; (IPC1-7): G01B11/10; G01B11/28; G01B11/30
Attorney, Agent or Firm:
Osamu Nakahira
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