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Patent Searching and Data


Title:
DEVICE FOR MEASURING AND CLASSIFYING VERY THIN CRYSTAL PIECE
Document Type and Number:
Japanese Patent JP2003040433
Kind Code:
A
Abstract:

To provide a device for measuring and classifying a crystal piece which can safely and stably supply and convey a very thin crystal piece without breaking and chipping it in a process of supply and conveyance.

In this device for measuring and classifying a crystal piece, a ball feeder 5 and a straight advancing feeder 4 are horizontally arranged, and a tilt angle of a crystal piece run face of the ball feeder 5 and a tilt angle of a crystal piece run face of a straight advancing feeder shoot 2 are inclined at the same angle (35 to 45 degrees). A rotation conveying part arranges the rotational center axis inclined so as to place a lower end face of a sucker nozzle 6 rotated with a rotary shaft serving as the center in parallel to the crystal piece run face of the straight advancing feeder shoot 2.


Inventors:
IWAMOTO KAZUO
Application Number:
JP2001223812A
Publication Date:
February 13, 2003
Filing Date:
July 25, 2001
Export Citation:
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Assignee:
HUMO LAB LTD
International Classes:
B07C5/00; B07C5/36; B65G29/00; B65G47/14; B65G47/26; B65G47/86; G01R31/00; G01N27/00; G01N27/30; H03H3/02; H05K13/02; (IPC1-7): B65G47/14; B07C5/36; B65G47/86; G01R31/00
Attorney, Agent or Firm:
Toshi Inoguchi