Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
DEVICE FOR MEASURING MULTICHANNEL TYPE SURFACE PLASMON RESONANCE PHENOMENON
Document Type and Number:
Japanese Patent JP2008281470
Kind Code:
A
Abstract:

To provide a device for measuring multichannel type surface plasmon resonance phenomenon that forms a prism on a sensor substrate by chemical etching to solve the botheration on operation caused by the introduction of the interface between the sensor substrate and the prism, and enter, by eliminating the affect of reflected light from places other than a sensing point and dividing beams emitted from a light source to improve an S/N ratio into N divisions equally with a beam splitter, them into only a sensing spot.

The device for measuring multichannel type surface plasmon resonance phenomenon includes the light source for emitting beams, an optical system for dividing the light source into N divisions of the same light intensity and equal beams, an optical system for entering each beams divided into the N divisions simultaneously so as to line-focus on a substrate where a metallic thin film and the prism are formed and each sensing point on the substrate at a fixed angle, and a calculation section for extracting an electric signal of a detector to perform an operation and a comparison, which is small-sized and enables simultaneous multipoint-measurement.


Inventors:
OGATA HIROMITSU
KAFUKU KEIICHI
Application Number:
JP2007126575A
Publication Date:
November 20, 2008
Filing Date:
May 11, 2007
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
ANDES DENKI KK
International Classes:
G01N21/27