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Title:
DEVICE AND METHOD FOR CHECKING RESIDUAL QUANTITY OF ACCUMULATED ELECTRICITY OF SECONDARY CELL
Document Type and Number:
Japanese Patent JP2004361221
Kind Code:
A
Abstract:

To provide a residual-quantity-of-accumulated-electricity checking device for secondary cells formed so as to measure a residual quantity of accumulated electricity of a secondary cell, using physical property values inherent in the secondary cell considering its characteristic.

The checking device 10 for a residual quantity of accumulated electricity of a secondary cell is provided with a voltage-to-be-applied supplying section 6 for supplying a voltage to be applied to the secondary cell 1, a current detecting section 3 for detecting the value of a current to be caused to flow in the secondary cell 1 when a checking voltage is applied to the secondary cell 1, a conversion means for deriving information on the residual quantity of the accumulated electricity of the secondary cell 1 from the detected current value, and a display section 7 for displaying the information on the residual quantity of the accumulated electricity.


Inventors:
TAKAOKA HIROMI
FUJIWARA TAKAMICHI
Application Number:
JP2003159440A
Publication Date:
December 24, 2004
Filing Date:
June 04, 2003
Export Citation:
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Assignee:
TECHNO CORE INTERNAT KK
International Classes:
G01R31/36; H01M10/48; H02J7/00; (IPC1-7): G01R31/36; H01M10/48; H02J7/00
Attorney, Agent or Firm:
Juichiro Yano