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Patent Searching and Data


Title:
DEVICE FOR SENSING SLIVER THICKNESS FLUCTUATION
Document Type and Number:
Japanese Patent JP2000154435
Kind Code:
A
Abstract:

To provide the subject device simple in structure and intended to smoothly measure the thickness of a sliver being in travel.

This device has a pair of a projected roller and a grooved roller 8 and a sensor element 30 supported so as to be mobile when energized; wherein the grooved roller 8 is radially and immobilely supported and has a bottomed groove extending along the outer circumferential surface, the projected roller 7 lies projected into the groove, forming a grip part together with the grooved roller 8, and a sliver 5 is compressed through the grip part and advanced by the action of the pair of the above rollers; the sensor element 30 also lies projected into the groove and presses the sliver 5 against the bottom of the groove in cooperation with the groove bottom on the upstream side of the grip part when viewed in the advancing direction of the sliver 5 and sets in motion according to the thickness fluctuation of the sliver passing the sensor element and the end of the groove bottom.


Inventors:
LEIFELD FERDINAND
CORRALES PEDRO
Application Number:
JP32691699A
Publication Date:
June 06, 2000
Filing Date:
November 17, 1999
Export Citation:
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Assignee:
TRUETZSCHLER GMBH & CO KG
International Classes:
B65H63/06; D01G23/04; D01H13/22; D01H4/00; D01H5/38; (IPC1-7): D01H13/22; D01H4/00
Attorney, Agent or Firm:
Takashi Ishida (3 others)