Title:
DIAGNOSTIC DEVICE FOR ABNORMALITY OF APPARATUS
Document Type and Number:
Japanese Patent JPH03255914
Kind Code:
A
Abstract:
PURPOSE:To make clear the cause of abnormality and to attain an efficient inspection for maintenance by forming the structure to use a membership function indicating a correlation between the grade of abnormal phenomenon and collected data. CONSTITUTION:By a temperature detector 1, data of bearing temperature of rotary machinery are collected for example, and similarly the vibration data of rotary machinery are collected by a vibration detector 2 which is installed on the bearing part or other parts of rotary machinery. The data of detectors 1, 2 are inputted to an arithmetic device 3 and referenced to the membership functions. The membership functions are set for each factor in terms of state quantum. By this reference, the grades are obtained for every factor. Then, the decision is quantitatively made by a decision device 4 based on the obtained grades. Each grade represents the certainty of the generation of abnormal phenomenon according to the each factor, and by such a decision, a rank settlement for certainty according to each factor, verification for exactness of the decision result, and automation of process are made possible.
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Inventors:
FUNAKOSHI HISASHI
Application Number:
JP5612090A
Publication Date:
November 14, 1991
Filing Date:
March 06, 1990
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP
International Classes:
G01D21/00; G05B13/02; (IPC1-7): G01D21/00; G05B13/02
Attorney, Agent or Firm:
Kenji Yoshida (2 outside)