Title:
DIFFRACTION GRATING SPECTROMETER
Document Type and Number:
Japanese Patent JP3125688
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To measure plural wavelength bands at the same time with a single optical meter without degrading performance, and to improve reliability, serviceability, and operativity with no mechanical driving part contained.
SOLUTION: An incident slit 1 limits an incident light. A folding mirror 2 makes an incident measuring light reflected. A collimating parabolic mirror 3 makes the reflected measuring light to be a parallel light. An echelle diffraction grating 4 receives the parallel light for diffraction. A light-condensing parabolic cylinder mirror 5 band-divides the diffraction light from the echelle diffraction grating 4 into wavelength bands. A light-condensing parabolic cylinder mirror 6 condenses each light flux which has been band-divided. A two dimensional array detector 7 images the condensed light flux, in spectral direction and in vertical direction, with the light-condensing parabolic cylinder mirror 6.
Inventors:
Akihiko Kuze
Application Number:
JP26415796A
Publication Date:
January 22, 2001
Filing Date:
October 04, 1996
Export Citation:
Assignee:
NEC
International Classes:
G01J3/18; G02B5/18; (IPC1-7): G01J3/18; G02B5/18
Domestic Patent References:
JP269637A | ||||
JP8193884A | ||||
JP9105672A | ||||
JP7301560A | ||||
JP675550A | ||||
JP5113024B2 | ||||
JP6502483A | ||||
JP8509293A |
Attorney, Agent or Firm:
Naoki Kyomoto (2 outside)