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Title:
DISPLAY AND DEFECT DETECTING METHOD
Document Type and Number:
Japanese Patent JP2009192909
Kind Code:
A
Abstract:

To provide a display and a defect detecting method in which a pixel defect generated in a pixel is easily detected.

The display 1 includes: a display panel 2 having a plurality of gate lines 22 and a gate line 22A for inspection crossing a source line 23 at right angles; a source driving control unit 3; a gate driving control unit 4; and an inspection circuit 5 which outputs electric charges held by respective pixels for inspection of the gate line 22A for inspection to a detection terminal to which a detecting means can be connected. Then, the display 1 includes: a source conduction control means 110 of controlling a conduction state of a current to the source line 23; a charging control means 120 of making a pixel to be inspected hold electric charges in a state wherein the current is allowed to flow to the source line 23; a charge movement control means 130 of moving electric charges from the pixel to be inspected to the pixels for inspection in a state wherein the current to the source line 23 is blocked; and an inspection charge output control means 140 of outputting the electric charges held by the pixels for inspection to the detection terminal in sequence.


Inventors:
MAEDA AKITOSHI
Application Number:
JP2008034520A
Publication Date:
August 27, 2009
Filing Date:
February 15, 2008
Export Citation:
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Assignee:
SEIKO EPSON CORP
International Classes:
G09G3/36; G01R31/00; G02F1/133; G09F9/00; G09F9/30; G09G3/20
Attorney, Agent or Firm:
Intellectual Property Office