Title:
DISPLAY DEVICE AND INSPECTION METHOD OF DISPLAY DEVICE
Document Type and Number:
Japanese Patent JP2023152563
Kind Code:
A
Abstract:
To reduce cost of inspection by a small-sized and simple structure, and to enable stable and diverse inspections.SOLUTION: A precharge circuits 31A and 31B are disposed on both sides of a gate line GL. The precharge circuits 32A and 32B are disposed on both sides of a data line DL. A common electrode inspection circuit 33 is connected to a common electrode. A test data processing circuit 34 is disposed at one end of the gate line GL. A test data processing circuit 35 is disposed at one end of the data line DL. In a first period, first voltage is supplied to a part of the gate line GL, the data line DL, and the common electrode. In a second period, second voltage is supplied to a part of the gate line GL, the data line DL, and the common electrode. The inspection data processing circuits 34 and 35 acquire voltage levels of the gate line GL and the data line DL which are based on supply of the second voltage.SELECTED DRAWING: Figure 1
Inventors:
OTOSE TOMOHIKO
Application Number:
JP2022062684A
Publication Date:
October 17, 2023
Filing Date:
April 04, 2022
Export Citation:
Assignee:
SHANGHAI TIANMA MICRO ELECT CO
International Classes:
G09G3/36; G01R31/00; G02F1/1368; G09G3/20
Attorney, Agent or Firm:
Mitsuru Kimura
Goro Saito
Yasushi Morikawa
Hiromi Yamamoto
Hiroyoshi Sato
Natsuki Yuasa
Narumi Nakamura
Goro Saito
Yasushi Morikawa
Hiromi Yamamoto
Hiroyoshi Sato
Natsuki Yuasa
Narumi Nakamura