Title:
測距装置及びその制御方法
Document Type and Number:
Japanese Patent JP7431193
Kind Code:
B2
Abstract:
In a distance measurement device that measures a distance to an object based on a time of flight taken until irradiation light is reflected by the object and returns to the distance measurement device, a brightness measurement unit measures an exposed electric charge amount as a brightness while a shift amount of an exposure gate is changed by an exposure gate shift control unit, and a light emission and exposure timing of another distance measurement device is set to a shift amount of the exposure gate where the brightness is maximized. The brightness measurement unit calculates a variation in the brightness of the exposed electric charge amount while the cycle of the exposure gate is changed, and it is determined that ½ of a value of the cycle of the exposure gate when the variation is minimized is a light emission cycle of the another distance measurement device.
Inventors:
Takeshi Imai
Application Number:
JP2021070312A
Publication Date:
February 14, 2024
Filing Date:
April 19, 2021
Export Citation:
Assignee:
Hitachi LG Data Storage Co., Ltd.
International Classes:
G01S7/4861; G01S7/495
Domestic Patent References:
| JP2021060246A | ||||
| JP2017190978A | ||||
| JP8015415A |
Foreign References:
| WO2020188782A1 | ||||
| US20200200873 |
Attorney, Agent or Firm:
Seiryo Patent Attorneys Corporation
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