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Title:
DISTORTION MEASURING APPARATUS
Document Type and Number:
Japanese Patent JP2001272203
Kind Code:
A
Abstract:

To provide a distortion measuring apparatus, which enables highly accurate measurement of distortions, even under the environment of relatively large temperature fluctuations.

This apparatus has a strain gauge, in which first and second resistors 2 and 3 are arranged in proximity to each other with the code of a gauge ratio opposite to each other with respect to as a prescribed distortion, a first bridge circuit corresponding to the first resistor 2, a second bridge circuit corresponding to the second resistor 3 and a differential amplification means 14 (third amplifier) for amplifying the difference between a signal, based on the output of the first bridge circuit and a signal which is based on the output of the second bridge circuit.


Inventors:
KANEKO SHINJI
Application Number:
JP2000085326A
Publication Date:
October 05, 2001
Filing Date:
March 24, 2000
Export Citation:
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Assignee:
OLYMPUS OPTICAL CO
International Classes:
G01L1/18; G01B7/16; G01D5/16; (IPC1-7): G01B7/16; G01D5/16; G01L1/18
Domestic Patent References:
JPH0243344A1990-02-13
JPH0346970U1991-04-30
JPH05141907A1993-06-08
JPS4318228B1
Attorney, Agent or Firm:
Takehiko Suzue (4 outside)