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Patent Searching and Data


Title:
DROP IMPACT TESTING MACHINE AND CLAMPING DEVICE OF JIG USED THEREIN
Document Type and Number:
Japanese Patent JP2005077176
Kind Code:
A
Abstract:

To provide a device capable of acquiring stable test data in a drop impact testing machine constituted so as to perform the drop impact test of a test sample by attaching the test sample 10 to a jig 1 to drop the jig 1.

In the drop impact testing machine equipped with the jig 1 to which the test sample 10 is attached, a holding unit for holding the jig 1 to a predetermined posture to drop the same and a collision stand with which the dropped jig 1 collides, a projection 15 is provided to the jig 1 used in this testing machine and the jig 1 always collides with the collision stand at one point of the projection 15 at the time of dropping. This projection 15 is made freely detachable with respect to the arbitrary surface of the jig 1 by a screw means.


Inventors:
HASHIMOTO YASUSHI
SASAKI KOJI
Application Number:
JP2003306046A
Publication Date:
March 24, 2005
Filing Date:
August 29, 2003
Export Citation:
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Assignee:
SONY CORP
International Classes:
G01N3/303; (IPC1-7): G01N3/303
Attorney, Agent or Firm:
Yoshitsuno Kakuda
Hironobu Isoyama