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Patent Searching and Data


Title:
ELECTRIC PROBE
Document Type and Number:
Japanese Patent JPH0460462
Kind Code:
A
Abstract:

PURPOSE: To enable use for highly accurate electric measurement by providing a connection part having a plurality of contact surfaces, a spring part conected thereto with a terminal for a force line at the other end thereof and a terminal for sensing closer to a contact part from the terminal for a force line.

CONSTITUTION: A force line 15 is connected to a terminal 13 for the force line and a sensing line 16 is connected to a terminal 14 for sensing. As a sensing is possible at a position near a terminal of an object to be measured in an electric measurement, noises can be checked. As contact surfaces 11a and 11b are arranged in plurality, other contact surfaces allow conduction even when he conduction is faulty in part with clogging by dirt or the like between the terminal and a contact part 11. This enables highly accurate electric measurement with a stable supply of a voltage, current and signal to the object to be measured.


Inventors:
IWABUCHI TAKESHI
Application Number:
JP17022190A
Publication Date:
February 26, 1992
Filing Date:
June 29, 1990
Export Citation:
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Assignee:
FUJITSU LTD
International Classes:
G01R1/067; H01R13/02; G01R31/26; (IPC1-7): G01R1/067; G01R31/26; H01R13/02
Attorney, Agent or Firm:
Aoki Akira (4 outside)