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Title:
ELECTRICAL CHARACTERISTIC MEASURING DEVICE AND METHOD
Document Type and Number:
Japanese Patent JP2011149750
Kind Code:
A
Abstract:

To perform high speed inspection of electrical characteristics of a high-functionality material on a metal film in the thickness direction all over the surface, in an electrically conductive sheet body.

An electrical characteristic measuring device includes, in the electrically conductive sheet body, a plurality of measurement metal guide roll for insulation displacement contact, an earth grounding metal guide roll for electrically connecting to the metal film with a low resistance; and a control circuit means for continuously measuring the electrical characteristics between the metal guide rolls for measurement and for earth grounding, while continuously moving the electrically conductive sheet body or the guide roll, wherein the electrical characteristic distribution in the thickness direction on the sheet surface is displayed.


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Inventors:
TANAKA SHIGEYA
KIKUCHI SHUJI
AOKI YASUKO
KANAZAWA MASAKAZU
Application Number:
JP2010009683A
Publication Date:
August 04, 2011
Filing Date:
January 20, 2010
Export Citation:
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Assignee:
HITACHI HIGH TECH CORP
International Classes:
G01N27/04; G01R27/02
Domestic Patent References:
JPH07260846A1995-10-13
JP2010040362A2010-02-18
JP2008210786A2008-09-11
JP2005249758A2005-09-15
JPS61275685A1986-12-05
JPH0954126A1997-02-25
JP2007123192A2007-05-17
Attorney, Agent or Firm:
Yusuke Hiraki



 
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