Title:
Electron beam irradiation equipment, multi-electron beam irradiation equipment, electronic beam exposure equipment, and an electron beam irradiation method
Document Type and Number:
Japanese Patent JP6018386
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a compact electron beam irradiation device in which throughput of an electron beam exposure device is enhanced.SOLUTION: The electron beam irradiation device outputing a plurality of electron beams includes a surface electron beam source having a plurality of electron emission parts which focuses electrons emitted, respectively, from the plurality of electron emission parts while accelerating and outputs as a plurality of electron beams, and an electron lens for irradiating an object with a drawing pattern formed of the plurality of electron beams output from the surface electron beam source with a predetermined magnification.
Inventors:
Masayoshi Esashi
Naokatsu Ikegami
Akira Kojima
Naokatsu Ikegami
Akira Kojima
Application Number:
JP2012027499A
Publication Date:
November 02, 2016
Filing Date:
February 10, 2012
Export Citation:
Assignee:
Tohoku University
National University Corporation Tokyo University of Agriculture and Technology
Crestec Co., Ltd.
National University Corporation Tokyo University of Agriculture and Technology
Crestec Co., Ltd.
International Classes:
H01J1/312; G03F7/20; H01J37/06; H01J37/305; H01L21/027
Domestic Patent References:
JP7192682A | ||||
JP8264108A | ||||
JP57187849A | ||||
JP2011510431A | ||||
JP2005317657A | ||||
JP2011181416A | ||||
JP2004055556A |
Attorney, Agent or Firm:
Longhua International Patent Service Corporation
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