Title:
ELECTRONIC COMPONENT INSPECTION PROBE, AND ELECTRONIC COMPONENT INSPECTION SOCKET EQUIPPED THEREWITH
Document Type and Number:
Japanese Patent JP3904564
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a probe capable of keeping mechanical strength of an insulator even when the thickness of the insulator arranged between conductors forming an electrode is reduced, which is a probe capable of Kelvin connection used for electric characteristic inspection of an electronic component.
SOLUTION: This electronic component inspection probe is characterized as follows: the probe comprises a pair of conductors connected together to one lead of an electronic component which is an inspection object and connected to a wiring part of a substrate connected to an inspection device, and an insulating structure for insulating the interval of the conductors; and the insulating structure comprises a metal body having an insulating layer at least on one surface in contact with the conductors.
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Inventors:
Kazuyuki Higashikawa
Nobuyuki Tamura
Nobuyuki Tamura
Application Number:
JP2004145402A
Publication Date:
April 11, 2007
Filing Date:
May 14, 2004
Export Citation:
Assignee:
Sanyu Industry Co., Ltd.
International Classes:
G01R1/073; G01R31/26; (IPC1-7): G01R1/073; G01R31/26
Domestic Patent References:
| JP2003123874A | ||||
| JP10199637A | ||||
| JP10223291A | ||||
| JP6049993U | ||||
| JP63105873U |
Attorney, Agent or Firm:
Masaaki Ogura