Title:
電子部品の寿命予測装置及び電子部品の寿命予測方法
Document Type and Number:
Japanese Patent JP7118589
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To predict the lifetime of electronic components in a short time.SOLUTION: An apparatus for predicting the lifetime of electronic components according to an embodiment includes a storage unit, a variation acquiring unit, and a lifetime calculating unit. After performing a composite load test simultaneously imparting a plurality of load factors, the storage unit stores the correlation between the variation in characteristic variation amounts in a plurality of first electronic components and the lifetime of a plurality of the first electronic components. The variation acquiring unit acquires the variation in characteristic variation amounts in a plurality of second electronic components after performing the composite load test. The lifetime calculation unit calculates the lifetime of the plurality of the second electronic components based on the correlation stored in the storage unit and the variation in the variation amounts of the acquired characteristics.SELECTED DRAWING: Figure 1
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Inventors:
Yuichi Kakumoto
Kazuya Murakami
Kazuya Murakami
Application Number:
JP2017001178A
Publication Date:
August 16, 2022
Filing Date:
January 06, 2017
Export Citation:
Assignee:
Toshiba Corporation
Toshiba Infrastructure Systems & Solutions Corporation
Toshiba Infrastructure Systems & Solutions Corporation
International Classes:
G01R31/00; G01R31/26; H01G13/00; H01L33/00
Domestic Patent References:
| JP2008282272A | ||||
| JP2002246391A | ||||
| JP2015002242A | ||||
| JP2016217942A |
Attorney, Agent or Firm:
Patent Attorney Sakura International Patent Office
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