Title:
元素分析方法、元素分析装置、及び、元素分析装置用プログラム
Document Type and Number:
Japanese Patent JP7322303
Kind Code:
B2
Abstract:
Provided is an element analysis method that is capable of maintaining accuracy of zero-point correction equivalent to that in the related art while shortening the time required for element analysis, and that includes heating a sample placed in a crucible in a heating furnace, and measuring an amount of an element contained in a gas discharged from the heating furnace by an analysis mechanism to analyze the element contained in the sample, the method including: a blank measurement step of measuring the amount of the element contained in the gas discharged from the heating furnace when only the crucible is heated; and a step of setting an amount of zero-point correction based on a measurement value in a transient state region where the measurement value rises in blank data obtained in the blank measurement step.
Inventors:
Takahito Inoue
Hiroshi Uchihara
Hiroshi Uchihara
Application Number:
JP2022558970A
Publication Date:
August 07, 2023
Filing Date:
October 08, 2021
Export Citation:
Assignee:
HORIBA, Ltd.
International Classes:
G01N31/12
Domestic Patent References:
| JP2745122B2 |
Foreign References:
| WO2020137147A1 | ||||
| WO2021182059A1 |
Attorney, Agent or Firm:
Ryuhei Nishimura
Shindai Saito
Atsushi Nakamura
Haruko Maeda
Mitsuoki Fukuda
Shindai Saito
Atsushi Nakamura
Haruko Maeda
Mitsuoki Fukuda
Previous Patent: Voltage detection circuit and method
Next Patent: PICTURE FORMATION SYSTEM FOR STEREOSCOPIC VISION
Next Patent: PICTURE FORMATION SYSTEM FOR STEREOSCOPIC VISION