Title:
EMITTED LIGHT RADIATING DEVICE
Document Type and Number:
Japanese Patent JP3463401
Kind Code:
B2
Abstract:
PURPOSE: To provide a device in which a mirror or spectroscope is never thermally damaged by providing first and second light deflecting means, and selecting either one of the light near the central axis and the light around the central axis to irradiate a sample.
CONSTITUTION: An emitted light 2 introduced into an optical beam 3a includes an X-ray near the horizontal central axis and a vacuum ultraviolet ray 2b around it. The X-ray 2a is passed through an optical beam pipe 3b, and directly emitted to a sample 7 set in a reaction chamber 6. The ultraviolet ray 2b is reflected by a light deflecting means 4, and the reflected light 2c is turned to a light deflecting means 5 through an optical beam pipe 35, passed through an optical pipe 3d, and emitted to the sample 7. Optical beam selecting means 8a, 8b selectively arrest the X-ray 2a and the ultraviolet ray 2d. According to this structure, a mirror or spectroscope is never exposed to the X-ray having a short wavelength, and thus never damaged thereby.
Inventors:
Tomohiko Kanie
Application Number:
JP6089895A
Publication Date:
November 05, 2003
Filing Date:
March 20, 1995
Export Citation:
Assignee:
Sumitomo Electric Industries, Ltd.
International Classes:
H05H13/04; (IPC1-7): H05H13/04
Domestic Patent References:
| JP417321A | ||||
| JP7301700A | ||||
| JP298121A | ||||
| JP4305200A | ||||
| JP444000A | ||||
| JP5297148A | ||||
| JP62224330A | ||||
| JP6273600A |
Attorney, Agent or Firm:
Fukami Hisaro (2 outside)