Title:
ABNORMALITY DIAGNOSTIC DEVICE AND ABNORMALITY DIAGNOSTIC METHOD FOR EQUIPMENT
Document Type and Number:
Japanese Patent JP2022137584
Kind Code:
A
Abstract:
To provide an abnormality diagnostic device and an abnormality diagnostic method for equipment, enabling reduction of influence of noise when diagnosing whether or not there is abnormality of the equipment in operation.SOLUTION: An abnormality diagnostic device 10 for equipment 1 is provided, diagnosing abnormality of the equipment 1 on the basis of time series waveform acquired by a sensor 11 provided in the equipment 1, the abnormality diagnostic device 10 comprises: a characteristic parameter calculation unit 14 which calculates each of characteristic parameters functioning as a diagnostic index and included in a first characteristic parameter group, for each of time series waveform data during a normal time, time series waveform data during an abnormal time, and time series waveform data during a diagnosis; a characteristic parameter selection unit 15 which, on the basis of an abnormality diagnostic index value, selects characteristic parameter to be used when diagnosing whether or not there is abnormality of the equipment; and a diagnosis unit 16 which calculates abnormality determination value on the basis of value of the characteristic parameter calculated from time series waveform data during a diagnosis and selected by the characteristic parameter selection unit 15 and diagnoses whether or not there is abnormality on the basis of the abnormality determination value.SELECTED DRAWING: Figure 1
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Inventors:
ISAKA KAZUTAKA
Application Number:
JP2021037126A
Publication Date:
September 22, 2022
Filing Date:
March 09, 2021
Export Citation:
Assignee:
MEIDENSHA ELECTRIC MFG CO LTD
International Classes:
G01M99/00; G01H17/00
Attorney, Agent or Firm:
Sonoda & Kobayashi Patent Attorneys Corporation