Title:
眼のコヒーレンス・トポグラフィック・レイトレーシング測定のための装置
Document Type and Number:
Japanese Patent JP4021242
Kind Code:
B2
Abstract:
Topographic measurement of eye structures based on short coherence interferometry is the subject of the invention. The problem occurring in this connection is that longitudinal and transverse eye movements during signal registration lead to errors in the measured structure. The influences of longitudinal eye movements are compensated in that the reference beam, independent from the measurement beam, is directed to the corneal vertex and is reflected at the latter. The influences of longitudinal eye movements are minimized in that the transverse position of the eye is monitored by means of a direction-dependent registration of the light reflected at the corneal vertex by means of a diode array or a four-quadrant diode and transverse misalignment is detected and compensated.
Inventors:
Adolf Friedrich Ferchel
Roland berth
Roland berth
Application Number:
JP2002147222A
Publication Date:
December 12, 2007
Filing Date:
May 22, 2002
Export Citation:
Assignee:
Carl Zeiss Jena Gezel Shaft Mitt Beschlenktel Haftung
International Classes:
A61B3/10; A61B3/107; A61B3/113; G01B9/02
Domestic Patent References:
JP7255672A | ||||
JP4135551A |
Foreign References:
WO1999060331A1 |
Attorney, Agent or Firm:
Sho Matsuda