Title:
光学観測窓を保護するための装置および方法
Document Type and Number:
Japanese Patent JP2013545062
Kind Code:
A
Abstract:
Shutter device (38) for protecting an optical observation opening (39) of a blast furnace against contamination from a dirt atmosphere, comprises a nozzle unit (53, 60) and a purge gas space (43, 64). The nozzle unit forms the aperture opening for the observation opening, which is used to form the purge gas flow. The purge gas space is formed between an optical surface of the observation opening and the aperture (26, 54, 63). The purge gas space is loaded with a purge gas. The purge gas is passed into the dirt atmosphere through the aperture opening. Shutter device (38) for protecting an optical observation opening (39) of a blast furnace against contamination from a dirt atmosphere, comprises a nozzle unit (53, 60) and a purge gas space (43, 64). The nozzle unit forms the aperture opening for the observation opening, which is used to form the purge gas flow. The purge gas space is formed between an optical surface of the observation opening and the aperture (26, 54, 63). The purge gas space is loaded with a purge gas. The purge gas is passed into the dirt atmosphere through the aperture opening. The nozzle unit exhibits a flow guide means, which defines a flow path, and causes the purge gas to escape from dirt atmosphere. An independent claim is also included for protecting an optical observation opening of a blast furnace against contamination from a dirt atmosphere, comprising (i) forming the nozzle unit as the aperture opening for the observation opening, which is used for forming the purge gas flow, (ii) forming the purge gas space between an optical surface of the observation opening and the aperture opening, (iii) loading the purge gas space with the purge gas, and passing the purge gas into the dirt atmosphere through the aperture opening.
Inventors:
Hans-Uwe Morgenstern
Ulrich Oster
Ulrich Oster
Application Number:
JP2013530657A
Publication Date:
December 19, 2013
Filing Date:
August 29, 2011
Export Citation:
Assignee:
TMT Tapping-Measuring-Technology GmbH
International Classes:
F27D21/02; C21B7/24
Domestic Patent References:
| JPS5052209U | 1975-05-20 | |||
| JPH06313540A | 1994-11-08 | |||
| JPH02259389A | 1990-10-22 | |||
| JPS5579989A | 1980-06-16 | |||
| JPH05160111A | 1993-06-25 | |||
| JP2007127359A | 2007-05-24 | |||
| JP2010002150A | 2010-01-07 | |||
| JPH01141755U | 1989-09-28 | |||
| JPS6236526A | 1987-02-17 | |||
| JP2000320833A | 2000-11-24 | |||
| JPH0455689A | 1992-02-24 |
Foreign References:
| US5306209A | 1994-04-26 |
Attorney, Agent or Firm:
Maeda patent office