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Patent Searching and Data


Title:
線状熱センサをテストする装置及び方法
Document Type and Number:
Japanese Patent JP6681806
Kind Code:
B2
Abstract:
A linear-thermal-sensor testing system has a signal generator 210 and a reflection analyzer 218. The signal generator generates a series of damped sinusoidal impulse signals each of a different frequency, and transmits the damped sinusoidal impulse signals to a first end of the linear thermal sensor 20. The linear thermal sensor generates a reflection signal corresponding to each of series the damped sinusoidal impulse signals at a plurality of electrical discontinuities in the linear thermal sensing array. The reflection analyzer receives a reflection signal from the first end of the linear thermal sensor. The reflection signal has indicia of electrical properties and locations within the linear thermal sensor for each of the plurality of electrical discontinuities. The reflection analyzer calculates the electrical properties and the locations within the linear thermal sensor based on the indicia of the received reflection signal.

Inventors:
Aaron Stanley Rogers
Application Number:
JP2016162314A
Publication Date:
April 15, 2020
Filing Date:
August 23, 2016
Export Citation:
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Assignee:
Kidda Technologies, Inc.
International Classes:
G01K15/00; B64D45/00; B64F5/60
Domestic Patent References:
JP2000310572A
JP2015102481A
JP2000213979A
Foreign References:
US7575371
Attorney, Agent or Firm:
Hiromichi Kobayashi
Tomioka Kiyoshi