To provide an erbium-doped silicon nanocrystalline-embedded silicon oxide waveguide that can be manufactured by low-temerature process and can operate at 1,540 nm, and to provide a method of manufacturing the same.
The method comprises steps for: forming a bottom layer; forming an Er-doped silicon nanocrystalline-embedded silixon oxide film overlying the bottom layer, which exhibits minimum optical attenuation at about 1,540 nm; and forming a top layer overlying the Er-doped silicon oxide film. The Er-doped silicon oxide film includes steps for: depositing a silicon rich silicon oxide (SRSO) film using a high density plasma chemical vapor deposition; annealing the SRSO film; implanting Er+ ions; and thereafter annealing the Er+-doped silicon oxide film again. The silicon oxide film including the Er-doped silicon nano-crystalline has a first refractive index (n) in a range of 1.46 to 2.30. Top and bottom layers have second refractive indexes smaller than the first refractive index.
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