Title:
誤り率測定装置、及び誤り率測定方法
Document Type and Number:
Japanese Patent JP7132986
Kind Code:
B2
Abstract:
To provide an error rate measuring device and an error rate measuring method capable of drawing an error rate contour diagram having an eye opening shape that is preferable for evaluating the signal quality of a signal to be measured with little collapse of the eye opening.SOLUTION: In an error rate measuring device 1, a measurement control unit 7d controls a threshold voltage operation control unit 7c, a phase operation control unit 7b, and an error rate measurement unit 3f to perform a measurement operation for measuring the error rate of a PAM 4 signal that is a signal to be measured. In accordance with this measurement operation, an eye diagram generation control unit 7e calculates the error rate/threshold voltage characteristic and an error rate/delay amount characteristic, and draws an eye diagram connecting points having equal error rates with continuous lines on the basis of the error rate/threshold voltage characteristic and the error rate/delay amount characteristic. A sweep frequency limiting unit 7d1 performs control to limit the number of sweeps related to the phase operation by a variable delay device 3d for measuring the error rate/delay amount characteristic to one.SELECTED DRAWING: Figure 4
Inventors:
Takashi Minami
Application Number:
JP2020148456A
Publication Date:
September 07, 2022
Filing Date:
September 03, 2020
Export Citation:
Assignee:
Anritsu Co., Ltd.
International Classes:
H04L25/02; G01R13/20; H04L25/49
Domestic Patent References:
| JP2008014916A | ||||
| JP2020136707A | ||||
| JP2005223991A |
Attorney, Agent or Firm:
Eiichiro Ariga
Ariga Gunichiro
Ariga Gunichiro