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Patent Searching and Data


Title:
EVALUATING METHOD AND EVALUATING DEVICE OF PHOTOCATALYST FUNCTION
Document Type and Number:
Japanese Patent JP2000162129
Kind Code:
A
Abstract:

To provide a method capable of evaluating photocatalyst function with a simple facility regardless of the material of a base material, and a device suitable for executing this method.

In this method comprising coloring the surface of a photocatalyst function film layer 2 formed on a base material 1, emitting ultraviolet ray to the colored surface, and measuring the absorbance or reflective index thereof to evaluate the function of the photocatalyst, the ultraviolet ray is continuously emitted during the measurement time, and the photocatalyst function is evaluated by the change of the value of transmittance or absorbance measured by emitting the measuring light during the measurement time. Each pair of cases for attachably and detachably housing a light emitting element or light receiving element, which has a base having a through-hole in the placing part of the base material 1 having the photocatalyst function film layer 2 with colored surface, and a black light lamp arranged in the front of the surface of the base material 1, is provided on the axial line passing the base material 1 opposite to each other in the longitudinal direction of the base material 1, and also on the reflected light axis in the front of the base material 1, respectively.


Inventors:
TAKASAKI YOICHI
MAEZONO AKIICHI
Application Number:
JP33948198A
Publication Date:
June 16, 2000
Filing Date:
November 30, 1998
Export Citation:
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Assignee:
SHINKU RIKO KK
FUJISHIMA AKIRA
International Classes:
G01N31/10; G01N21/33; G01N21/78; G01N33/00; (IPC1-7): G01N21/78; G01N21/33; G01N31/10; G01N33/00
Attorney, Agent or Firm:
Kinichi Kitamura (3 others)